Noise Analysis and Measurement for Active Pixel Sensor Readout Methods - Paperback

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by Dali Wu (Author)A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon... Read more

SKU: 9783639361544
Barcode: 9783639361544

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    Description

    by Dali Wu (Author)

    A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.

    Number of Pages: 92
    Dimensions: 0.22 x 9 x 6 IN
    Publication Date: June 05, 2011

    Specifications

    • Weight: 200gr
    • Usage: Indoor & outdoor

    Pros and cons

    • Sustainably produced
    • Ideal for everyday use
    • May discolor in direct sunlight
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